Test Solutions

Test Solutions

Paramit’s founders come from one of the most complex test environments in the world: semiconductor test equipment. As a result, we also maintain a large staff of degreed electrical and mechanical engineers who are knowledgeable in product and test design. They take on the design and development of PCA in-circuit and functional tests as well as subsystem and final system tests for the completed device or instrument — eliminating the need for youto provide on-site engineering support.

System Assembly Testing

A single medical device or life science instrument may include hundreds of components and subassemblies from numerous manufacturers and multiple processes involving complex technologies such as mechatronics, fluidics, optics, and RF. Before we integrate any subsystems into the final device, we firstdevelop and execute comprehensive tests to verify that each subsystem functions properly. This investment of time and effort during the build process has proven to save time and reduce expenses in the long run by eliminating the need to disassemble finished products containing defective PCAs or subsystems.

PCA Testing

Printed circuit board assemblies (PCAs) undergo numerous tests to identify failure points and potential defects.

Automatic X-ray (5DX)

Paramit developed and currently maintains a PCA process of 10 defects per million opportunities (DPMO). However, a flawed board can pass all tests even when the integrity of the BGA (ball grid array) solder joints is questionable. To address this concern, Paramit performs an automated x-ray (5DX) inspection on all hidden solder joints. This inspection process combined with low levels of rework and a very high process yield ensure that every PCA will have optimum long-term reliability.

In-Circuit Testing (ICT)

ICT verifies electrical continuity, component values and orientation, and the timing of specified circuits. Paramit’s ICT test development team has extensive experience developing high-end custom solutions such as in-system programming for EEPROMs (electrically erasable programmable read-only memory) and PLDs (programmable logic devices), functional/cluster testing, boundary scan, BIST (built-in self-test) and data collection/analysis.

PCA Functional Testing

PCA functional testing ensures the board performs as designed in a real-world environment. Paramit’s test team focuses on three goals for optimizing this testing process in the production environment:

  1. Thoroughly exercising the PCA to verify it will perform flawlessly within its design parameters once installed in a device.
  2. Streamlining the test process by reducing the time and resources required to perform the test while still maintaining the integrity of the test.
  3. Identifying and correcting the root causes of failures in addition to repairing individual failures. Our highly skilled team can reduce your costs and significantly increase throughput during functional testing.

We also use PCA process validation to validate the expected outputs for every piece of equipment.