Our Strengths

Test Engineering

Success in the test environment requires tremendous effort from properly qualified and trained personnel, and Paramit’s test engineering team is at the core of this effort.

Test engineers are organized into two closely-knit groups: Development Test Engineers (DTEs) and Product Test Engineers (PTEs). DTEs support tester development and maintenance, while PTEs are the primary interface for customer test issues.

DTEs utilize strong technical skills for development of test hardware (including schematic capture and layout) and test software for a variety of test processes, and provide Paramit the capability to offer full turn-key test solutions quickly and cost-effectively.

Paramit sustains one of the highest TE-to-production ratios in the industry.

Technical Depth

Our large test engineering staff allows us to provide a highly qualified interface to our customers’ engineering team, so customers don’t need to train personnel or provide on-site engineering support. These engineers handle data analysis, assembly debug, operator training, and test fixture support, as well as component failure analysis, upgrades to existing test setups, and full turnkey test development.

Technical Breadth

Paramit’s technical team has a broad base of industry experience, which includes technologies such as RF, networking, digital media, industrial controls, robotics, optics and others. We are also experienced with all levels of electrical testing -- from Flying Probe and ICT through functional and reliability screening.

Paramit’s complete turnkey test solutions and full breadth of experience allow our customers to focus on their core product development efforts.

Custom Software Solutions

Paramit has developed useful custom software solutions and reports that allow for easy access to and efficient management of test data. Some key test solutions include CAD translators, in-circuit and functional test libraries, automated test coverage and DFT reports, real-time process monitoring and controls, detailed parametric test data collection, and extensive defect analysis reporting. New programs are constantly being developed to support the needs of test engineering.