Test Solutions

When you outsource test, you require a partner with in-depth industry experience, the ability to rapidly understand how your products work, and the test development expertise to smoothly transition them to production. Once in production, you rely on your outsourcing partner to manage all test, repair, and maintenance activities, as well as reduce costs and increase test coverage.

Paramit has built a foundation of test services over the last 20 years, and it is one of our key points of excellence. We have a large, experienced technical staff, and best-in-class equipment to meet the most demanding test development and production requirements.

Benefits of Paramit’s Test Solutions

• Lower testing costs through standardized platforms and processes
• Great flexibility to test prototype, low-volume, and high-volume products
• Rapid identification and correction of defects, increasing yield and lower costs
• Hassle-free, turnkey solutions
• Confidence that your products will be tested rigorously and pass or exceed all performance and reliability standards

Key Elements of Paramit’s Test Solutions

• Functional and System Test. Paramit offers full, turnkey functional test development using a standardized ATE platform that allows us to provide a dramatically lower-cost solution by eliminating the need for you to purchase equipment for every test set-up. If an ATE test set-up already exists or "hot mock-up" is provided, Paramit can easily duplicate, enhance and support these systems.
• Flying Probe. A Teradyne Javelin flying probe tester supports prototype and low-volume production needs, and is also an excellent low-cost solution for recovering "bonepile" inventory on products lacking sufficient test and debug capabilities.
• In-Circuit Test. ICT is the backbone of Paramit's test processes. It supports rapid feedback of defects to the manufacturing floor, and helps lower overall test costs by increasing yields in all downstream processes. Paramit's ICT test development team has extensive experience developing high-end custom solutions such as in-system programming for EEPROMs and PLDs, functional/cluster testing, boundary scan, BIST and data collection/ analysis. ICT currently supports the Agilent 3070 and Genrad 228X platforms.
• Boundary Scan and BIST. Paramit can support all IEEE 1149.1-compliant boundary scan testing using Flynn Systems' OnTap test and development package. Support of any BIST requirements is also available using a test setup custom designed for the BIST protocol being used.
• Reliability Screening. Paramit offers a 1000-square foot burn-in room and multiple ESS ovens to provide rigorous reliability screening and provide turnkey solutions that can automatically control or monitor all ESS activities. This includes control and/or monitoring of temperature profiles, power cycling, power margining, external testing, embedded testing, data collection, and safety systems.
• Test Engineering Services. Our test engineers provide many services beyond typical test development and repair. These services greatly enhance the value Paramit provides to our customers, and include the following:
  • Component failure analysis
  • Test fixture debug, calibration and maintenance
  • Design-for-Test (DFT) and test coverage analysis
  • Test strategy evaluation including ROI analysis
  • On-going product reliability analysis and monitoring

Contact Us

Please contact us to discuss your test requirements with Paramit's test solutions team