Functional and System Test
Paramit offers full, turnkey functional test development using a standardized ATE platform that allows us to provide a dramatically lower-cost solution by eliminating the need for customers to purchase equipment for every test set-up. If an ATE test set-up already exists or "hot mock-up" is provided, Paramit can easily duplicate, enhance and support these systems.
Flying Probe
A Teradyne Javelin flying probe tester supports prototype and low-volume production needs, and is also an excellent low-cost solution for recovering "bonepile" inventory on products lacking sufficient test and debug capabilities.
In-Circuit Test
ICT is the backbone of Paramit’s test processes. It supports rapid feedback of defects to the manufacturing floor, and helps lower overall test costs by increasing yields in all downstream processes. Paramit’s ICT test development team has extensive experience developing high-end custom solutions such as in-system programming for EEPROMs and PLDs, functional/cluster testing, boundary scan, BIST and data collection/ analysis. ICT currently supports the Agilent 3070 and Genrad 228X platforms.
Boundary Scan and BIST
Paramit can support all IEEE 1149.1-compliant boundary scan testing using Flynn Systems’ OnTap test and development package. Support of any BIST requirements is also available using a test setup custom designed for the BIST protocol being used.
Reliability Screening
Paramit offers a 1000-square foot burn-in room and multiple ESS ovens to provide rigorous reliability screening and provide turnkey solutions that can automatically control or monitor all ESS activities. This includes control and/or monitoring of temperature profiles, power cycling, power margining, external testing, embedded testing, data collection and safety systems.
Test Engineering Services
Test engineers provide many services beyond typical test development and repair. These services greatly enhance the value Paramit provides to our customers, and include the following:
- Component failure analysis
- Test fixture debug, calibration and maintenance
- Design-for-Test (DFT) and test coverage analysis
- Test strategy evaluation including ROI analysis
- On-going product reliability analysis and monitoring